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dc.contributor.advisorMoore, Professor Andrew J.
dc.contributor.authorNguyen, Dinh Thi
dc.date.accessioned2017-05-02T10:55:49Z
dc.date.available2017-05-02T10:55:49Z
dc.date.issued2016-08
dc.identifier.urihttp://hdl.handle.net/10399/3175
dc.description.abstractIn the area of metrology and non-destructive testing, Terahertz wavelengths have been widely researched and used. However, the lack of 2D detectors working at room temperature and high power sources prevent the widespread application of Terahertz in industry. In that context, research on the development of new Terahertz equipment is moving at a fast pace. Within the scope of this thesis, applications of newly developed Terahertz technologies were explored using the scanning of single point detectors with the objective to establish the feasibility for their full-field applications in readiness for future 2D detectors. For the first time, a frequency tuneable, all-optical Terahertz source was implemented in multi-wavelength interferometry to overcome one wavelength ambiguity in precise thickness/distance measurements with sub-millimetre resolution. Phase-shifting digital holography is another interferometry technique which allows us to reconstruct not only the amplitude of one object, but also the phase and the depth of it, using existing mathematical algorithms. Digital holography was performed successfully at Terahertz wavelengths using a multiplier/mixer Terahertz source coupled with a single point pyroelectric detector for the applications of non-destructive testing and depth measurements. The novelty is that the phase-stepping technique for digital holography was implemented in THz frequencies for the first time to remove unwanted terms in the reconstructed image in order to improve image quality compare to conventional holography. In the current experiments, recording time for one set of phase-shifting holograms (4 holograms for 4 phase-steps algorithm) was 6 hours. When the technology is ready for 2D detectors, recording time of holograms could be reduced considerably, and the technique will play an important role in full-field applications in industry metrology and/or non-destructive testing and evaluation.en_US
dc.description.sponsorshipEPSRCen_US
dc.language.isoenen_US
dc.publisherHeriot-Watt Universityen_US
dc.publisherEngineering and Physical Sciencesen_US
dc.rightsAll items in ROS are protected by the Creative Commons copyright license (http://creativecommons.org/licenses/by-nc-nd/2.5/scotland/), with some rights reserved.
dc.titleTerahertz for subsurface imaging and metrology applicationsen_US
dc.typeThesisen_US


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