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dc.contributor.advisorKar, Professor Ajoy
dc.contributor.authorRayer, Mathieu
dc.date.accessioned2017-03-10T15:11:43Z
dc.date.available2017-03-10T15:11:43Z
dc.date.issued2015-05
dc.identifier.urihttp://hdl.handle.net/10399/3149
dc.description.abstractAbstract and full text not available - restricted until 26.04.2018. Please refer to PDFen_US
dc.description.sponsorshipEngineering and Physical Sciences Research Council (EPSRC) scholarshipen_US
dc.language.isoenen_US
dc.publisherHeriot-Watt Universityen_US
dc.publisherEngineering and Physical Sciencesen_US
dc.rightsAll items in ROS are protected by the Creative Commons copyright license (http://creativecommons.org/licenses/by-nc-nd/2.5/scotland/), with some rights reserved.
dc.titleChromatic confocal gauging for high precision dimensional metrologyen_US
dc.typeThesisen_US


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