Show simple item record

Evolutionary modular neural networks for run-time data analysis across semiconductor test area processes and equipment.

dc.contributor.authorMiguelanez Martin, Emilioen
dc.date.accessioned2008-10-22T14:38:45Z
dc.date.available2011-03-02T00:00:00Zen
dc.date.available2008-10-22T14:38:45Z
dc.date.issued2006en
dc.identifier.urihttp://hdl.handle.net/10399/2015
dc.format.mediumNot currently available online. A paper copy may be available – please contact the Library for help.en
dc.language.isoen
dc.publisherHeriot-Watt Universityen
dc.publisherEngineering and Physical Sciencesen
dc.rightsAll items in ROS are protected by the Creative Commons copyright license (http://creativecommons.org/licenses/by-nc-nd/2.5/scotland/), with all rights reserved.en
dc.titleEvolutionary modular neural networks for run-time data analysis across semiconductor test area processes and equipment.en
dc.typethesisen


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record